Advances in Imaging and Electron Physics, Volume 211, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
1. Cover image - p. iv 2. Title page - p. iv 3. Table of Contents - p. iv 4. Copyright - p. iv 5. Contributors - p. vii 6. Preface - p. ix 7. Chapter One: Simulation of atomically resolved elemental maps with a multislice algorithm for relativistic electrons - p. ix 8. Chapter Two: Reviewing the revised International System of Units (SI) - p. 120 9. Chapter Three: Electron energy loss spectroscopy in the electron microscope - p. 186 10. Index - p. 305
Advances in Imaging and Electron Physics, Volume 211, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
1. Cover image - p. iv 2. Title page - p. iv 3. Table of Contents - p. iv 4. Copyright - p. iv 5. Contributors - p. vii 6. Preface - p. ix 7. Chapter One: Simulation of atomically resolved elemental maps with a multislice algorithm for relativistic electrons - p. ix 8. Chapter Two: Reviewing the revised International System of Units (SI) - p. 120 9. Chapter Three: Electron energy loss spectroscopy in the electron microscope - p. 186 10. Index - p. 305
