Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
1. 1. Introduction 2. 2. Preliminaries of GANIP 3. 3. GAN-Based Mathematical Morphology 4. 4. GAN-Based Choquet Filtering 5. 5. GAN-Based Distance Transforms 6. 6. Application Issues 7. 7. Concluding Discussion and Perspectives 8. Acknowledgments 9. Shape Recognition Based on Eigenvalues of the Laplacian 10. 1. Introduction 11. 2. Related Work 12. 3. Eigenvalues of the Dirichlet and Neumann Laplacians 13. 4. The Clamped Plate and Buckling of a Clamped Plate Problems 14. 5. Lessons from Simple Shapes 15. 6. Computation of the Eigenvalues 16. 7. Features Based on the Eigenvalues of the Various Problems Considered 17. 8. Artificial Neural Networks 18. 9. Experimental Results 19. 10. Conclusion 20. Acknowledgments 21. Point Set Analysis 22. 1. Introduction 23. 2. Motivation, Related Issues, and Notations 24. 3. A New Spectrum of Shapes for UPS Analysis 25. 4. Applications of Mesh Morphological Operators 26. 5. Discussion 27. 6. Conclusions and Future Research 28. Image Recovery from Sparse Samples, Discrete Sampling Theorem, and Sharply Bounded Band-Limited Discrete Signals 29. 1. Introduction: Sparse Sampling 30. 2. Discrete Sampling Theorem 31. 3. Algorithms for Signal Recovery from Sparse Sampled Data 32. 4. Analysis of Transforms 33. 5. Selection of Transform for Image Band-Limited Approximation 34. 6. Application Examples 35. 7. Sharply Band-Limited Discrete Signals with Sharply Limited Support 36. 8. Conclusion
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
1. 1. Introduction 2. 2. Preliminaries of GANIP 3. 3. GAN-Based Mathematical Morphology 4. 4. GAN-Based Choquet Filtering 5. 5. GAN-Based Distance Transforms 6. 6. Application Issues 7. 7. Concluding Discussion and Perspectives 8. Acknowledgments 9. Shape Recognition Based on Eigenvalues of the Laplacian 10. 1. Introduction 11. 2. Related Work 12. 3. Eigenvalues of the Dirichlet and Neumann Laplacians 13. 4. The Clamped Plate and Buckling of a Clamped Plate Problems 14. 5. Lessons from Simple Shapes 15. 6. Computation of the Eigenvalues 16. 7. Features Based on the Eigenvalues of the Various Problems Considered 17. 8. Artificial Neural Networks 18. 9. Experimental Results 19. 10. Conclusion 20. Acknowledgments 21. Point Set Analysis 22. 1. Introduction 23. 2. Motivation, Related Issues, and Notations 24. 3. A New Spectrum of Shapes for UPS Analysis 25. 4. Applications of Mesh Morphological Operators 26. 5. Discussion 27. 6. Conclusions and Future Research 28. Image Recovery from Sparse Samples, Discrete Sampling Theorem, and Sharply Bounded Band-Limited Discrete Signals 29. 1. Introduction: Sparse Sampling 30. 2. Discrete Sampling Theorem 31. 3. Algorithms for Signal Recovery from Sparse Sampled Data 32. 4. Analysis of Transforms 33. 5. Selection of Transform for Image Band-Limited Approximation 34. 6. Application Examples 35. 7. Sharply Band-Limited Discrete Signals with Sharply Limited Support 36. 8. Conclusion
