Characterization of Nanoparticles: Measurement Processes for Nanoparticles surveys this fast growing field, including established methods for the physical and chemical characterization of nanoparticles. The book focuses on sample preparation issues (including potential pitfalls), with measurement procedures described in detail. In addition, the book explores data reduction, including the quantitative evaluation of the final result and its uncertainty of measurement. The results of published inter-laboratory comparisons are referred to, along with the availability of reference materials necessary for instrument calibration and method validation. The application of these methods are illustrated with practical examples on what is routine and what remains a challenge.
In addition, this book summarizes promising methods still under development and analyzes the need for complementary methods to enhance the quality of nanoparticle characterization with solutions already in operation.
1. Chapter 1: Introduction - p. xvii 2. Chapter 2.1.1: Characterization of nanoparticles by scanning electron microscopy - p. 6 3. Chapter 2.1.2: Characterization of nanomaterials by transmission electron microscopy: Measurement procedures - p. 27 4. Chapter 2.1.3: Scanning probe microscopy (SPM) - p. 48 5. Chapter 3.1.1: Single particle inductively coupled plasma mass spectrometry (spICP-MS) - p. 63 6. Chapter 3.1.2: Particle Tracking Analysis (PTA) - p. 77 7. Chapter 3.1.3: Electrospray-differential mobility analysis (ES-DMA) - p. 96 8. Chapter 3.1.4: Tunable resistive pulse sensing (TRPS) - p. 116 9. Chapter 3.2.1: Dynamic light scattering (DLS) - p. 136 10. Chapter 3.2.2: Small angle x-ray scattering (SAXS) - p. 172 11. Chapter 3.2.3: Ultraviolet–visible spectrophotometry - p. 183 12. Chapter 3.2.4: Acoustic spectroscopy for particle size measurement of concentrated nanodispersions - p. 196 13. Chapter 3.2.5: Zeta-potential measurements - p. 211 14. Chapter 3.3.1: Analytical centrifugation - p. 224 15. Chapter 3.3.2: Field-flow fractionation (FFF) with various detection systems - p. 247 16. Chapter 4.1: Volume-specific surface area by gas adsorption analysis with the BET method - p. 264 17. Chapter 4.2: Preparation of nanoparticles for surface analysis - p. 294 18. Chapter 4.3.1: X-ray photoelectron spectroscopy - p. 347 19. Chapter 4.3.2: Auger electron spectroscopy - p. 371 20. Chapter 4.4: Energy-dispersive X-ray spectroscopy (EDS) - p. 395 21. Chapter 4.5.1: Low-energy ion scattering (LEIS) - p. 417 22. Chapter 4.5.2: Rutherford backscattering spectroscopy (RBS) and medium energy ion scattering (MEIS) - p. 439 23. Chapter 4.6: Vibrational spectroscopy - p. 455 24. Chapter 4.7: Secondary ion mass spectrometry - p. 480 25. Chapter 5: International standards in nanotechnologies - p. 509 26. Chapter 6: Conclusions and perspectives - p. 525 27. Index - p. 535
Characterization of Nanoparticles: Measurement Processes for Nanoparticles surveys this fast growing field, including established methods for the physical and chemical characterization of nanoparticles. The book focuses on sample preparation issues (including potential pitfalls), with measurement procedures described in detail. In addition, the book explores data reduction, including the quantitative evaluation of the final result and its uncertainty of measurement. The results of published inter-laboratory comparisons are referred to, along with the availability of reference materials necessary for instrument calibration and method validation. The application of these methods are illustrated with practical examples on what is routine and what remains a challenge.
In addition, this book summarizes promising methods still under development and analyzes the need for complementary methods to enhance the quality of nanoparticle characterization with solutions already in operation.
1. Chapter 1: Introduction - p. xvii 2. Chapter 2.1.1: Characterization of nanoparticles by scanning electron microscopy - p. 6 3. Chapter 2.1.2: Characterization of nanomaterials by transmission electron microscopy: Measurement procedures - p. 27 4. Chapter 2.1.3: Scanning probe microscopy (SPM) - p. 48 5. Chapter 3.1.1: Single particle inductively coupled plasma mass spectrometry (spICP-MS) - p. 63 6. Chapter 3.1.2: Particle Tracking Analysis (PTA) - p. 77 7. Chapter 3.1.3: Electrospray-differential mobility analysis (ES-DMA) - p. 96 8. Chapter 3.1.4: Tunable resistive pulse sensing (TRPS) - p. 116 9. Chapter 3.2.1: Dynamic light scattering (DLS) - p. 136 10. Chapter 3.2.2: Small angle x-ray scattering (SAXS) - p. 172 11. Chapter 3.2.3: Ultraviolet–visible spectrophotometry - p. 183 12. Chapter 3.2.4: Acoustic spectroscopy for particle size measurement of concentrated nanodispersions - p. 196 13. Chapter 3.2.5: Zeta-potential measurements - p. 211 14. Chapter 3.3.1: Analytical centrifugation - p. 224 15. Chapter 3.3.2: Field-flow fractionation (FFF) with various detection systems - p. 247 16. Chapter 4.1: Volume-specific surface area by gas adsorption analysis with the BET method - p. 264 17. Chapter 4.2: Preparation of nanoparticles for surface analysis - p. 294 18. Chapter 4.3.1: X-ray photoelectron spectroscopy - p. 347 19. Chapter 4.3.2: Auger electron spectroscopy - p. 371 20. Chapter 4.4: Energy-dispersive X-ray spectroscopy (EDS) - p. 395 21. Chapter 4.5.1: Low-energy ion scattering (LEIS) - p. 417 22. Chapter 4.5.2: Rutherford backscattering spectroscopy (RBS) and medium energy ion scattering (MEIS) - p. 439 23. Chapter 4.6: Vibrational spectroscopy - p. 455 24. Chapter 4.7: Secondary ion mass spectrometry - p. 480 25. Chapter 5: International standards in nanotechnologies - p. 509 26. Chapter 6: Conclusions and perspectives - p. 525 27. Index - p. 535
