Nanocharacterization Techniques covers the main characterization techniques used in nanomaterials and nanostructures. The chapters focus on the fundamental aspects of characterization techniques and their distinctive approaches. Significant advances that have taken place over recent years in refining techniques are covered, and the mathematical foundations needed to use the techniques are also explained in detail. This book is an important reference for materials scientists and engineers looking for a through analysis of nanocharacterization techniques in order to establish which is best for their needs.
1. Cover - p. i 2. Title page - p. iii 3. Table of Contents - p. iii 4. Copyright - p. ii 5. List of Contributors - p. iv 6. Editor Biographies - p. x 7. 1: Scanning Electron Microscopy - p. xi 8. 2: Atomic Force Microscopy: A Powerful Tool for Electrical Characterization - p. 35 9. 3: Spectroscopic Techniques for Characterization of Nanomaterials - p. 64 10. 4: Dynamic Light Scattering Applied to Nanoparticle Characterization - p. 98 11. 5: X-Ray Diffraction and Scattering by Nanomaterials - p. 110 12. Abstract - p. 110 13. 1. X-Ray Diffraction Applied to the Study of Nanocrystalline Powders - p. 112 14. 2. Small-Angle X-Ray Scattering - p. 135 15. 3. GISAXS and ASAXS - p. 152 16. 6: Surface Plasmon Resonance (SPR) for Sensors and Biosensors - p. 182 17. Index - p. 200
Nanocharacterization Techniques covers the main characterization techniques used in nanomaterials and nanostructures. The chapters focus on the fundamental aspects of characterization techniques and their distinctive approaches. Significant advances that have taken place over recent years in refining techniques are covered, and the mathematical foundations needed to use the techniques are also explained in detail. This book is an important reference for materials scientists and engineers looking for a through analysis of nanocharacterization techniques in order to establish which is best for their needs.
1. Cover - p. i 2. Title page - p. iii 3. Table of Contents - p. iii 4. Copyright - p. ii 5. List of Contributors - p. iv 6. Editor Biographies - p. x 7. 1: Scanning Electron Microscopy - p. xi 8. 2: Atomic Force Microscopy: A Powerful Tool for Electrical Characterization - p. 35 9. 3: Spectroscopic Techniques for Characterization of Nanomaterials - p. 64 10. 4: Dynamic Light Scattering Applied to Nanoparticle Characterization - p. 98 11. 5: X-Ray Diffraction and Scattering by Nanomaterials - p. 110 12. Abstract - p. 110 13. 1. X-Ray Diffraction Applied to the Study of Nanocrystalline Powders - p. 112 14. 2. Small-Angle X-Ray Scattering - p. 135 15. 3. GISAXS and ASAXS - p. 152 16. 6: Surface Plasmon Resonance (SPR) for Sensors and Biosensors - p. 182 17. Index - p. 200
