Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended practices for measurements and data processing for various SPM techniques, also discussing associated numerical techniques and recommendations for further reading for particular physical quantities measurements. Each chapter has been revised and updated for this new edition to reflect the progress that has been made in SPM techniques in recent years. New features for this edition include more step-by-step examples, better sample data and more links to related documentation in open source software.
Scanning Probe Microscopy (SPM) techniques have the potential to produce information on various local physical properties. Unfortunately, there is still a large gap between what is measured by commercial devices and what could be considered as a quantitative result. This book determines to educate and close that gap.
Associated data sets can be downloaded from http://gwyddion.net/qspm/
1. Cover image - p. iv 2. Title page - p. iv 3. Table of Contents - p. iv 4. Copyright - p. iv 5. List of Contributors - p. xiii 6. Preface to the Second Edition - p. xv 7. Preface to the First Edition - p. xvii 8. Chapter 1: Motivation - p. xviii 9. Chapter 2: Instrumentation Principles - p. 18 10. Chapter 3: Data Models - p. 37 11. Chapter 4: Basic Data Processing - p. 63 12. Chapter 5: Dimensional Measurements - p. 96 13. Chapter 6: Force and Mechanical Properties - p. 149 14. Chapter 7: Friction and Lateral Forces - p. 201 15. Chapter 8: Electrostatic Fields - p. 221 16. Chapter 9: Magnetic Fields - p. 243 17. Chapter 10: Local Current Measurements - p. 263 18. Chapter 11: Thermal Measurements - p. 301 19. Chapter 12: Optical Measurements - p. 332 20. Chapter 13: Sample Data Files - p. 367 21. Chapter 14: Numerical Modeling Techniques - p. 372 22. Index - p. 395
Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended practices for measurements and data processing for various SPM techniques, also discussing associated numerical techniques and recommendations for further reading for particular physical quantities measurements. Each chapter has been revised and updated for this new edition to reflect the progress that has been made in SPM techniques in recent years. New features for this edition include more step-by-step examples, better sample data and more links to related documentation in open source software.
Scanning Probe Microscopy (SPM) techniques have the potential to produce information on various local physical properties. Unfortunately, there is still a large gap between what is measured by commercial devices and what could be considered as a quantitative result. This book determines to educate and close that gap.
Associated data sets can be downloaded from http://gwyddion.net/qspm/
1. Cover image - p. iv 2. Title page - p. iv 3. Table of Contents - p. iv 4. Copyright - p. iv 5. List of Contributors - p. xiii 6. Preface to the Second Edition - p. xv 7. Preface to the First Edition - p. xvii 8. Chapter 1: Motivation - p. xviii 9. Chapter 2: Instrumentation Principles - p. 18 10. Chapter 3: Data Models - p. 37 11. Chapter 4: Basic Data Processing - p. 63 12. Chapter 5: Dimensional Measurements - p. 96 13. Chapter 6: Force and Mechanical Properties - p. 149 14. Chapter 7: Friction and Lateral Forces - p. 201 15. Chapter 8: Electrostatic Fields - p. 221 16. Chapter 9: Magnetic Fields - p. 243 17. Chapter 10: Local Current Measurements - p. 263 18. Chapter 11: Thermal Measurements - p. 301 19. Chapter 12: Optical Measurements - p. 332 20. Chapter 13: Sample Data Files - p. 367 21. Chapter 14: Numerical Modeling Techniques - p. 372 22. Index - p. 395
