Sensors, Circuits, and Systems for Scientific Instruments: A Unified Approach presents a unified treatment of modern measurement systems by integrating relevant knowledge in sensors, circuits, signal processing, and machine learning. It also presents detailed case studies of several real-life measurement systems to illustrate how theoretical analysis and high-level designs are translated into working scientific instruments.
The book is meant for upper-level undergraduate and beginning graduate students in electrical and computer engineering, applied physics, and biomedical engineering. It is designed to fill a gap in the market between books focused on specific components of measurement systems (semiconductor devices, analog circuits, digital signal processing, etc.) and books that provide a high-level "survey" or "handbook"-type overview of a wide range of sensors and measurement systems.
1. 1.1 Introduction - p. page1 2. 1.2 Transfer functions - p. page1 3. 1.3 Lumped systems - p. 6 4. 1.4 Distributed systems - p. 12 5. 1.5 Multi-dimensional systems - p. 27 6. 1.6 Summary and further reading - p. page26 7. Exercises - p. page27 8. References - p. page30 9. Chapter 2. Principles of measurement-system design - p. 31 10. Abstract - p. 31 11. 2.1 Introduction - p. page31 12. 2.2 Fundamental properties of measurements - p. page31 13. 2.3 Theory of classical measurements - p. 38 14. 2.4 Feedback systems - p. 46 15. 2.5 Design of feedback controllers - p. 69 16. 2.6 Summary and further reading - p. 92 17. Exercises - p. 93 18. References - p. page97 19. Chapter 3. Review of solid-state device physics - p. 99 20. Chapter 4. Models of electronic devices - p. 123 21. Abstract - p. 123 22. 4.1 Introduction - p. page123 23. 4.2 Resistors - p. page123 24. 4.3 Capacitors - p. page127 25. 4.4 Inductors - p. 136 26. 4.5 Transformers - p. 154 27. 4.6 Diodes - p. page163 28. 4.7 Bipolar junction transistors - p. 178 29. 4.8 Metal-oxide-semiconductor field-effect transistors (MOSFETs) - p. 188 30. 4.9 Junction field-effect transistors (JFETs) - p. 205 31. 4.10 Summary and further reading - p. 208 32. Exercises - p. 208 33. References - p. page212 34. Chapter 5. Models of sensors and actuators - p. 213 35. Abstract - p. 213 36. 5.1 Introduction - p. page213 37. 5.2 Magnetic devices - p. page213 38. 5.3 Mechanical systems - p. 226 39. 5.4 Thermal sensors - p. 258 40. 5.5 Gas sensors - p. 276 41. 5.6 Acoustic sensors - p. page282 42. 5.7 Modeling and simulation methods - p. page293 43. 5.8 Summary and further reading - p. 297 44. Exercises - p. page296 45. References - p. page303 46. Chapter 6. Noise in electronic devices - p. 305 47. Abstract - p. 305 48. 6.1 Introduction - p. 305 49. 6.2 Heat, temperature, and thermodynamics - p. 305 50. 6.3 Noise processes - p. 306 51. 6.4 The resistor - p. 310 52. 6.5 The junction diode - p. 311 53. 6.6 Noise in BJTs - p. 313 54. 6.7 The subthreshold MOSFET - p. 315 55. 6.8 The above-threshold MOSFET - p. 317 56. 6.9 Noise calculations based on transit time - p. 319 57. 6.10 Noise in JFETs - p. 332 58. 6.11 The resistor at high frequencies - p. 332 59. 6.12 The fluctuation–dissipation theorem - p. 338 60. 6.13 Noise in antennas - p. 342 61. 6.14 Flicker noise - p. 343 62. 6.15 Noise in other transistors - p. 360 63. 6.16 Summary and further reading - p. 360 64. Exercises - p. 362 65. References - p. page365 66. Chapter 7. Noise in circuits - p. 367 67. Abstract - p. 367 68. 7.1 Introduction - p. page367 69. 7.2 General considerations - p. page367 70. 7.3 Example 1: a passive RC low-pass filter - p. 368 71. 7.4 Example 2: a subthreshold photoreceptor - p. 372 72. 7.5 The equipartition theorem - p. page371 73. 7.6 Noise-analysis procedure - p. page376 74. 7.7 Example 3: a subthreshold OTA - p. 377 75. 7.8 Example 4: a switched-capacitor resistor - p. page387 76. 7.9 Example 5: passive mixers - p. 390 77. 7.10 Example 6: an active mixer - p. 411 78. 7.11 Example 7: a cascade of low-pass filters - p. 415 79. 7.12 Summary and further reading - p. 416 80. Exercises - p. 417 81. References - p. page421 82. Chapter 8. Low-noise front-end design - p. 423 83. Abstract - p. 423 84. 8.1 Introduction - p. page423 85. 8.2 Receiver characteristics - p. page423 86. 8.3 Input-impedance matching - p. 424 87. 8.4 Input-referred noise models - p. 430 88. 8.5 Derivation of NF from two-port network parameters - p. 433 89. 8.6 Active impedance transformers - p. 437 90. 8.7 High-impedance measurements - p. 449 91. 8.8 Summary and further reading - p. 459 92. Exercises - p. 460 93. References - p. 466 94. Chapter 9. Precision circuit techniques - p. 469 95. Abstract - p. 469 96. 9.1 Introduction - p. page469 97. 9.2 Low-noise amplifier (LNA) design - p. page469 98. 9.3 Fully differential circuits - p. 483 99. 9.4 Low-frequency noise-reduction methods - p. page486 100. 9.5 Cross-spectrum noise measurements - p. 506 101. 9.6 Summary and further reading - p. 509 102. Exercises - p. 510 103. References - p. page517 104. Chapter 10. Power supplies and thermal management - p. 519 105. Abstract - p. 519 106. 10.1 Introduction - p. page519 107. 10.2 DC power supplies - p. page519 108. 10.3 Thermal analysis - p. 562 109. 10.4 Summary and further reading - p. 572 110. Exercises - p. 573 111. References - p. page580 112. Chapter 11. High-power front-end design - p. 583 113. Chapter 12. Front-end design for extreme environments - p. 617 114. Chapter 13. Oscillators and frequency references - p. 661 115. Abstract - p. 661 116. 13.1 Introduction - p. page661 117. 13.2 Time–frequency measurements and clocks - p. page661 118. 13.3 Types of oscillators - p. page669 119. 13.4 Noise in oscillators - p. 684 120. 13.5 Long-term behavior of oscillators - p. 700 121. 13.6 Frequency-measurement instruments - p. page705 122. 13.7 Summary and further reading - p. 711 123. Exercises - p. 712 124. References - p. 717 125. Chapter 14. Phase-locked loops - p. 721 126. Abstract - p. 721 127. 14.1 Introduction - p. page721 128. 14.2 Design of phase-locked loops - p. page721 129. 14.3 Noise in phase-locked loops - p. 749 130. 14.4 Injection locking - p. 752 131. 14.5 Frequency synthesizers - p. 763 132. 14.6 All-digital PLLs - p. 772 133. 14.7 GPS-disciplined oscillators (GPSDOs) - p. 776 134. 14.8 Direct digital synthesis (DDS) - p. 775 135. 14.9 Delay-locked loops - p. 784 136. 14.10 Summary and further reading - p. 794 137. Exercises - p. 795 138. References - p. 800 139. Chapter 15. Frequency standards - p. 803 140. Abstract - p. 803 141. 15.1 Introduction - p. page803 142. 15.2 General properties of atomic clocks - p. page803 143. 15.3 Rubidium frequency standards - p. 804 144. 15.4 Caesium frequency standards - p. page815 145. 15.5 Optical frequency standards - p. 837 146. 15.6 Summary and further reading - p. 840 147. Exercises - p. 841 148. References - p. page843 149. Index - p. 845
Sensors, Circuits, and Systems for Scientific Instruments: A Unified Approach presents a unified treatment of modern measurement systems by integrating relevant knowledge in sensors, circuits, signal processing, and machine learning. It also presents detailed case studies of several real-life measurement systems to illustrate how theoretical analysis and high-level designs are translated into working scientific instruments.
The book is meant for upper-level undergraduate and beginning graduate students in electrical and computer engineering, applied physics, and biomedical engineering. It is designed to fill a gap in the market between books focused on specific components of measurement systems (semiconductor devices, analog circuits, digital signal processing, etc.) and books that provide a high-level "survey" or "handbook"-type overview of a wide range of sensors and measurement systems.
1. 1.1 Introduction - p. page1 2. 1.2 Transfer functions - p. page1 3. 1.3 Lumped systems - p. 6 4. 1.4 Distributed systems - p. 12 5. 1.5 Multi-dimensional systems - p. 27 6. 1.6 Summary and further reading - p. page26 7. Exercises - p. page27 8. References - p. page30 9. Chapter 2. Principles of measurement-system design - p. 31 10. Abstract - p. 31 11. 2.1 Introduction - p. page31 12. 2.2 Fundamental properties of measurements - p. page31 13. 2.3 Theory of classical measurements - p. 38 14. 2.4 Feedback systems - p. 46 15. 2.5 Design of feedback controllers - p. 69 16. 2.6 Summary and further reading - p. 92 17. Exercises - p. 93 18. References - p. page97 19. Chapter 3. Review of solid-state device physics - p. 99 20. Chapter 4. Models of electronic devices - p. 123 21. Abstract - p. 123 22. 4.1 Introduction - p. page123 23. 4.2 Resistors - p. page123 24. 4.3 Capacitors - p. page127 25. 4.4 Inductors - p. 136 26. 4.5 Transformers - p. 154 27. 4.6 Diodes - p. page163 28. 4.7 Bipolar junction transistors - p. 178 29. 4.8 Metal-oxide-semiconductor field-effect transistors (MOSFETs) - p. 188 30. 4.9 Junction field-effect transistors (JFETs) - p. 205 31. 4.10 Summary and further reading - p. 208 32. Exercises - p. 208 33. References - p. page212 34. Chapter 5. Models of sensors and actuators - p. 213 35. Abstract - p. 213 36. 5.1 Introduction - p. page213 37. 5.2 Magnetic devices - p. page213 38. 5.3 Mechanical systems - p. 226 39. 5.4 Thermal sensors - p. 258 40. 5.5 Gas sensors - p. 276 41. 5.6 Acoustic sensors - p. page282 42. 5.7 Modeling and simulation methods - p. page293 43. 5.8 Summary and further reading - p. 297 44. Exercises - p. page296 45. References - p. page303 46. Chapter 6. Noise in electronic devices - p. 305 47. Abstract - p. 305 48. 6.1 Introduction - p. 305 49. 6.2 Heat, temperature, and thermodynamics - p. 305 50. 6.3 Noise processes - p. 306 51. 6.4 The resistor - p. 310 52. 6.5 The junction diode - p. 311 53. 6.6 Noise in BJTs - p. 313 54. 6.7 The subthreshold MOSFET - p. 315 55. 6.8 The above-threshold MOSFET - p. 317 56. 6.9 Noise calculations based on transit time - p. 319 57. 6.10 Noise in JFETs - p. 332 58. 6.11 The resistor at high frequencies - p. 332 59. 6.12 The fluctuation–dissipation theorem - p. 338 60. 6.13 Noise in antennas - p. 342 61. 6.14 Flicker noise - p. 343 62. 6.15 Noise in other transistors - p. 360 63. 6.16 Summary and further reading - p. 360 64. Exercises - p. 362 65. References - p. page365 66. Chapter 7. Noise in circuits - p. 367 67. Abstract - p. 367 68. 7.1 Introduction - p. page367 69. 7.2 General considerations - p. page367 70. 7.3 Example 1: a passive RC low-pass filter - p. 368 71. 7.4 Example 2: a subthreshold photoreceptor - p. 372 72. 7.5 The equipartition theorem - p. page371 73. 7.6 Noise-analysis procedure - p. page376 74. 7.7 Example 3: a subthreshold OTA - p. 377 75. 7.8 Example 4: a switched-capacitor resistor - p. page387 76. 7.9 Example 5: passive mixers - p. 390 77. 7.10 Example 6: an active mixer - p. 411 78. 7.11 Example 7: a cascade of low-pass filters - p. 415 79. 7.12 Summary and further reading - p. 416 80. Exercises - p. 417 81. References - p. page421 82. Chapter 8. Low-noise front-end design - p. 423 83. Abstract - p. 423 84. 8.1 Introduction - p. page423 85. 8.2 Receiver characteristics - p. page423 86. 8.3 Input-impedance matching - p. 424 87. 8.4 Input-referred noise models - p. 430 88. 8.5 Derivation of NF from two-port network parameters - p. 433 89. 8.6 Active impedance transformers - p. 437 90. 8.7 High-impedance measurements - p. 449 91. 8.8 Summary and further reading - p. 459 92. Exercises - p. 460 93. References - p. 466 94. Chapter 9. Precision circuit techniques - p. 469 95. Abstract - p. 469 96. 9.1 Introduction - p. page469 97. 9.2 Low-noise amplifier (LNA) design - p. page469 98. 9.3 Fully differential circuits - p. 483 99. 9.4 Low-frequency noise-reduction methods - p. page486 100. 9.5 Cross-spectrum noise measurements - p. 506 101. 9.6 Summary and further reading - p. 509 102. Exercises - p. 510 103. References - p. page517 104. Chapter 10. Power supplies and thermal management - p. 519 105. Abstract - p. 519 106. 10.1 Introduction - p. page519 107. 10.2 DC power supplies - p. page519 108. 10.3 Thermal analysis - p. 562 109. 10.4 Summary and further reading - p. 572 110. Exercises - p. 573 111. References - p. page580 112. Chapter 11. High-power front-end design - p. 583 113. Chapter 12. Front-end design for extreme environments - p. 617 114. Chapter 13. Oscillators and frequency references - p. 661 115. Abstract - p. 661 116. 13.1 Introduction - p. page661 117. 13.2 Time–frequency measurements and clocks - p. page661 118. 13.3 Types of oscillators - p. page669 119. 13.4 Noise in oscillators - p. 684 120. 13.5 Long-term behavior of oscillators - p. 700 121. 13.6 Frequency-measurement instruments - p. page705 122. 13.7 Summary and further reading - p. 711 123. Exercises - p. 712 124. References - p. 717 125. Chapter 14. Phase-locked loops - p. 721 126. Abstract - p. 721 127. 14.1 Introduction - p. page721 128. 14.2 Design of phase-locked loops - p. page721 129. 14.3 Noise in phase-locked loops - p. 749 130. 14.4 Injection locking - p. 752 131. 14.5 Frequency synthesizers - p. 763 132. 14.6 All-digital PLLs - p. 772 133. 14.7 GPS-disciplined oscillators (GPSDOs) - p. 776 134. 14.8 Direct digital synthesis (DDS) - p. 775 135. 14.9 Delay-locked loops - p. 784 136. 14.10 Summary and further reading - p. 794 137. Exercises - p. 795 138. References - p. 800 139. Chapter 15. Frequency standards - p. 803 140. Abstract - p. 803 141. 15.1 Introduction - p. page803 142. 15.2 General properties of atomic clocks - p. page803 143. 15.3 Rubidium frequency standards - p. 804 144. 15.4 Caesium frequency standards - p. page815 145. 15.5 Optical frequency standards - p. 837 146. 15.6 Summary and further reading - p. 840 147. Exercises - p. 841 148. References - p. page843 149. Index - p. 845
