Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Key features:
* Contributions from leading authorities * Informs and updates on all the latest developments in the field
1. 1. Introduction 2. 2. Overview of Measurement Methods and Instrumentation 3. 3. Transmission Line and S-Parameters 4. 4. Millimeter-Wave Network Analyzers 5. 5. Cascading of S-Parameters and Transmission/Transfer T-Parameters 6. 6. Calibration and De-Embedding at MM-Waves 7. References 8. Chapter Two. Transmission Lines and Passive Components 9. 1. Introduction 10. 2. Silicon Integrated Circuits and Technology 11. 3. Transmission Lines 12. 4. Electromagnetics of Transmission Lines and Their Discontinuities 13. 5. Transitions 14. 6. Capacitors, Inductors, and Resistors 15. 7. Resonators and Filters for Silicon Integrations of Increased Frequencies 16. 8. Power Dividers And Directional Couplers for SI-Integrated Circuits 17. 9. Packaging of Millimeter-Wave Components and Chips 18. 10. Conclusions 19. References 20. Chapter Three. Modeling and Design of High-Frequency Structures Using Artificial Neural Networks and Space Mapping 21. Chapter Four. Nanoscale FETs 22. Chapter Five. RF MEMS Devices for Communication Systems 23. Chapter Six. Substrate-Integrated Antennas on Silicon 24. Color Plates 25. Subject Index 26. Contents of Volumes 151-173
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Key features:
* Contributions from leading authorities * Informs and updates on all the latest developments in the field
1. 1. Introduction 2. 2. Overview of Measurement Methods and Instrumentation 3. 3. Transmission Line and S-Parameters 4. 4. Millimeter-Wave Network Analyzers 5. 5. Cascading of S-Parameters and Transmission/Transfer T-Parameters 6. 6. Calibration and De-Embedding at MM-Waves 7. References 8. Chapter Two. Transmission Lines and Passive Components 9. 1. Introduction 10. 2. Silicon Integrated Circuits and Technology 11. 3. Transmission Lines 12. 4. Electromagnetics of Transmission Lines and Their Discontinuities 13. 5. Transitions 14. 6. Capacitors, Inductors, and Resistors 15. 7. Resonators and Filters for Silicon Integrations of Increased Frequencies 16. 8. Power Dividers And Directional Couplers for SI-Integrated Circuits 17. 9. Packaging of Millimeter-Wave Components and Chips 18. 10. Conclusions 19. References 20. Chapter Three. Modeling and Design of High-Frequency Structures Using Artificial Neural Networks and Space Mapping 21. Chapter Four. Nanoscale FETs 22. Chapter Five. RF MEMS Devices for Communication Systems 23. Chapter Six. Substrate-Integrated Antennas on Silicon 24. Color Plates 25. Subject Index 26. Contents of Volumes 151-173
