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Descripción

Nanomaterials Characterization Techniques, Volume Two, part of an ongoing series, offers a detailed analysis of the different types of spectroscopic methods currently being used in nanocharacterization. These include, for example, the Raman spectroscopic method for the characterization of carbon nanotubes (CNTs).

This book outlines the different kinds of spectroscopic tools being used for the characterization of nanomaterials and discusses under what conditions each should be used. The book is intended to cover all the major spectroscopic techniques for nanocharacterization, making it an important resource for both the academic community at the research level and the industrial community involved in nanomanufacturing.

  • Explores how spectroscopy and X-ray-based nanocharacterization techniques are applied in modern industry
  • Analyzes all the major spectroscopy and X-ray-based nanocharacterization techniques, allowing the reader to choose the best for their situation
  • Presents a method-orientated approach that explains how to successfully use each technique

1. 10.1. Introduction to Dielectric Spectroscopy - p. 237 2. 10.2. Dielectric Polarizations - p. 241 3. 10.3. Dielectric Relaxations - p. 244 4. 10.4. Dielectric Formalism - p. 245 5. 10.5. Nanotechnology and Nanomaterials - p. 249 6. 10.6. Dielectric Behavior of Nanomaterials - p. 250 7. 10.7. Conclusions - p. 285 8. Chapter 11. Dielectric and Magnetic Loss Behavior of Nanooxides - p. 301 9. Chapter 12. Mössbauer Spectroscopy: Basic Principles and Practical Guide to Exotic Mössbauer Isotopes - p. 321 10. Chapter 13. Nuclear Magnetic Resonance Spectroscopy - p. 369 11. Index - p. 417

Descripcion
Descripción

Nanomaterials Characterization Techniques, Volume Two, part of an ongoing series, offers a detailed analysis of the different types of spectroscopic methods currently being used in nanocharacterization. These include, for example, the Raman spectroscopic method for the characterization of carbon nanotubes (CNTs).

This book outlines the different kinds of spectroscopic tools being used for the characterization of nanomaterials and discusses under what conditions each should be used. The book is intended to cover all the major spectroscopic techniques for nanocharacterization, making it an important resource for both the academic community at the research level and the industrial community involved in nanomanufacturing.

  • Explores how spectroscopy and X-ray-based nanocharacterization techniques are applied in modern industry
  • Analyzes all the major spectroscopy and X-ray-based nanocharacterization techniques, allowing the reader to choose the best for their situation
  • Presents a method-orientated approach that explains how to successfully use each technique

1. 10.1. Introduction to Dielectric Spectroscopy - p. 237 2. 10.2. Dielectric Polarizations - p. 241 3. 10.3. Dielectric Relaxations - p. 244 4. 10.4. Dielectric Formalism - p. 245 5. 10.5. Nanotechnology and Nanomaterials - p. 249 6. 10.6. Dielectric Behavior of Nanomaterials - p. 250 7. 10.7. Conclusions - p. 285 8. Chapter 11. Dielectric and Magnetic Loss Behavior of Nanooxides - p. 301 9. Chapter 12. Mössbauer Spectroscopy: Basic Principles and Practical Guide to Exotic Mössbauer Isotopes - p. 321 10. Chapter 13. Nuclear Magnetic Resonance Spectroscopy - p. 369 11. Index - p. 417

Indice
Autores
Muestra
Ficha Técnica