Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
1. 1. Introduction 2. 2. Precession Electron Diffraction: Geometry and Diffracted Intensities 3. 3. Structure Solution Using Precession Electron Diffraction 4. 4. Applications and New Developments of PED 5. 5. Conclusions 6. Acknowledgments 7. Scanning Helium Ion Microscopy 8. 1. Introduction 9. 2. Scanning Helium Ion Microscope 10. 3. Applications 11. 4. Future Developments 12. 5. Conclusion 13. Acknowledgments 14. Signal Reconstruction Algorithm Based on a Single Intensity in the Fresnel Domain 15. 1. Introduction 16. 2. Theory 17. 3. The Recursive Algorithm 18. 4. Numerical Results 19. 5. Conclusions 20. Acknowledgments 21. Electron Microscopy Studies on Magnetic L10-Type FePd Nanoparticles 22. 1. Introduction 23. 2. Experimental Procedures 24. 3. Atomic Ordering and Hard Magnetic Properties 25. 4. Determination of Order Parameter by Electron Diffraction 26. 5. Atomic Structure Imaging of Nanoparticles 27. 6. 3D Shapes and Distribution of Nanoparticles 28. 7. Concluding Remarks 29. Acknowledgments 30. Fundamental Aspects of Near-Field Emission Scanning Electron Microscopy 31. 1. Introduction 32. 2. Instrumentation 33. 3. Experimental Results 34. 4. Lensless Focusing 35. 5. Summary and Outlook 36. Acknowledgments
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
1. 1. Introduction 2. 2. Precession Electron Diffraction: Geometry and Diffracted Intensities 3. 3. Structure Solution Using Precession Electron Diffraction 4. 4. Applications and New Developments of PED 5. 5. Conclusions 6. Acknowledgments 7. Scanning Helium Ion Microscopy 8. 1. Introduction 9. 2. Scanning Helium Ion Microscope 10. 3. Applications 11. 4. Future Developments 12. 5. Conclusion 13. Acknowledgments 14. Signal Reconstruction Algorithm Based on a Single Intensity in the Fresnel Domain 15. 1. Introduction 16. 2. Theory 17. 3. The Recursive Algorithm 18. 4. Numerical Results 19. 5. Conclusions 20. Acknowledgments 21. Electron Microscopy Studies on Magnetic L10-Type FePd Nanoparticles 22. 1. Introduction 23. 2. Experimental Procedures 24. 3. Atomic Ordering and Hard Magnetic Properties 25. 4. Determination of Order Parameter by Electron Diffraction 26. 5. Atomic Structure Imaging of Nanoparticles 27. 6. 3D Shapes and Distribution of Nanoparticles 28. 7. Concluding Remarks 29. Acknowledgments 30. Fundamental Aspects of Near-Field Emission Scanning Electron Microscopy 31. 1. Introduction 32. 2. Instrumentation 33. 3. Experimental Results 34. 4. Lensless Focusing 35. 5. Summary and Outlook 36. Acknowledgments
