Advances in Imaging and Electron Physics, Volume 205 is the latest release in this series that merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
1. Cover image - p. iv 2. Title page - p. iv 3. Table of Contents - p. iv 4. Copyright - p. iv 5. Contributors - p. vii 6. Preface - p. ix 7. Chapter One: The Early Electron Microscopes: A Critical Study - p. xi 8. Chapter Two: Electron Optics of Low-Voltage Electron Beam Testing and Inspection. Part I: Simulation Tools - p. 137 9. Index - p. 269
Advances in Imaging and Electron Physics, Volume 205 is the latest release in this series that merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
1. Cover image - p. iv 2. Title page - p. iv 3. Table of Contents - p. iv 4. Copyright - p. iv 5. Contributors - p. vii 6. Preface - p. ix 7. Chapter One: The Early Electron Microscopes: A Critical Study - p. xi 8. Chapter Two: Electron Optics of Low-Voltage Electron Beam Testing and Inspection. Part I: Simulation Tools - p. 137 9. Index - p. 269
