Advances in Imaging and Electron Physics, Volume 207, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
1. Cover image - p. iv 2. Title page - p. iv 3. Table of Contents - p. iv 4. Copyright - p. iv 5. Contributors - p. vii 6. Preface - p. ix 7. Chapter One: Ultrafast Transmission Electron Microscopy: Historical Development, Instrumentation, and Applications - p. ix 8. Chapter Two: Refinement of Generalized Mean Inequalities and Connections with Divergence Measures - p. 72 9. Chapter Three: The Optical Transfer Theory of the Electron Microscope: Fundamental Principles and Applications - p. 249 10. Index - p. 343
Advances in Imaging and Electron Physics, Volume 207, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
1. Cover image - p. iv 2. Title page - p. iv 3. Table of Contents - p. iv 4. Copyright - p. iv 5. Contributors - p. vii 6. Preface - p. ix 7. Chapter One: Ultrafast Transmission Electron Microscopy: Historical Development, Instrumentation, and Applications - p. ix 8. Chapter Two: Refinement of Generalized Mean Inequalities and Connections with Divergence Measures - p. 72 9. Chapter Three: The Optical Transfer Theory of the Electron Microscope: Fundamental Principles and Applications - p. 249 10. Index - p. 343
