Advances in Imaging and Electron Physics, Volume 226 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
1. 1 Introduction - p. 7 2. 2 Relativistic wave equation - p. 6 3. 3 Pseudo-hyperspherical coordinates - p. 10 4. 4 Four-dimensional angular momentum - p. 24 5. 5 Photon and massless quarks (quarkinos) - p. 23 6. 6 Four-dimensional scalar potentials - p. 29 7. 7 Neutrinos - p. 28 8. 8 Massive two-component systems - p. 32 9. 9 Electron and positron - p. 35 10. 10 Propagation in free space - p. 38 11. 11 Electron propagating in the electromagnetic field - p. 40 12. 12 The hydrogen atom revisited - p. 42 13. 13 Lamb shift - p. 48 14. 14 The proton problem - p. 50 15. 15 Conclusions - p. 52 16. References - p. 60 17. Chapter Two: Electron diffractive optics based on the magnetic Aharonov–Bohm effect - p. 63 18. Chapter Three: Electronic image recording in conventional electron microscopy - p. 95 19. Abstract - p. 96 20. List of symbols - p. 96 21. 1 Introduction - p. 98 22. 2 Theoretical fundamentals - p. 101 23. 3 TV-image intensifier designs - p. 124 24. 4 Primary pulse height distribution of scintillators - p. 142 25. 5 Single image storage - p. 149 26. 6 Storage of image series - p. 152 27. 7 Image processing - p. 154 28. 8 Concluding remarks - p. 156 29. Acknowledgments - p. 158 30. References - p. 160 31. Chapter Four: The phase problem in electron microscopy - p. 163 32. Abstract - p. 164 33. 1 Introduction - p. 164 34. 2 Indirect methods for solving the phase problem - p. 171 35. 3 Direct methods for solving the phase problem - p. 197 36. 4 Uniqueness of the phase solution - p. 219 37. 5 Holography and the electron microscope - p. 228 38. 6 Practical problems in phase determination - p. 238 39. 7 Interpretation and use of phase information - p. 247 40. 8 Discussion on phase determination and refinement techniques - p. 260 41. Acknowledgments - p. 259 42. References - p. 259 43. Author index - p. 262 44. Subject index - p. 262
Advances in Imaging and Electron Physics, Volume 226 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
1. 1 Introduction - p. 7 2. 2 Relativistic wave equation - p. 6 3. 3 Pseudo-hyperspherical coordinates - p. 10 4. 4 Four-dimensional angular momentum - p. 24 5. 5 Photon and massless quarks (quarkinos) - p. 23 6. 6 Four-dimensional scalar potentials - p. 29 7. 7 Neutrinos - p. 28 8. 8 Massive two-component systems - p. 32 9. 9 Electron and positron - p. 35 10. 10 Propagation in free space - p. 38 11. 11 Electron propagating in the electromagnetic field - p. 40 12. 12 The hydrogen atom revisited - p. 42 13. 13 Lamb shift - p. 48 14. 14 The proton problem - p. 50 15. 15 Conclusions - p. 52 16. References - p. 60 17. Chapter Two: Electron diffractive optics based on the magnetic Aharonov–Bohm effect - p. 63 18. Chapter Three: Electronic image recording in conventional electron microscopy - p. 95 19. Abstract - p. 96 20. List of symbols - p. 96 21. 1 Introduction - p. 98 22. 2 Theoretical fundamentals - p. 101 23. 3 TV-image intensifier designs - p. 124 24. 4 Primary pulse height distribution of scintillators - p. 142 25. 5 Single image storage - p. 149 26. 6 Storage of image series - p. 152 27. 7 Image processing - p. 154 28. 8 Concluding remarks - p. 156 29. Acknowledgments - p. 158 30. References - p. 160 31. Chapter Four: The phase problem in electron microscopy - p. 163 32. Abstract - p. 164 33. 1 Introduction - p. 164 34. 2 Indirect methods for solving the phase problem - p. 171 35. 3 Direct methods for solving the phase problem - p. 197 36. 4 Uniqueness of the phase solution - p. 219 37. 5 Holography and the electron microscope - p. 228 38. 6 Practical problems in phase determination - p. 238 39. 7 Interpretation and use of phase information - p. 247 40. 8 Discussion on phase determination and refinement techniques - p. 260 41. Acknowledgments - p. 259 42. References - p. 259 43. Author index - p. 262 44. Subject index - p. 262
