Optics of Charged Particles, 2nd edition, describes how charged particles move in the fields of magnetic and electrostatic dipoles, quadrupoles, higher order multipoles, and field-free regions. Since the first edition, published over 30 years ago, new technologies have emerged and have been used for new ion optical instruments like, for instance, time-of-flight mass analyzers, which are described now. Fully updated and revised, this new edition provides ways to design mass separators, spectrographs, and spectrometers, which are the key tools in organic chemistry and for drug developments, in environmental trace analyses and for investigations in nuclear physics like the search for super heavy elements as well as molecules in space science.
The book discusses individual particle trajectories as well as particle beams in space and in phase-space, and it provides guidelines for the design of particle optical instruments. For experienced researchers, working in the field, it highlights the latest developments in new ion optical instruments and provides guidelines and examples for the design of new instruments for the transport of beams of charged particles and the mass/charge or energy/charge analyses of ions. Furthermore, it provides background knowledge required to accurately understand and analyze results, when developing ion-optical instruments.
By providing a comprehensive overview of the field of charged particle optics, this edition of the book supports all those working, directly or indirectly, with charged-particle research or the development of ion- and electron-analyzing instruments.
1. Title of Book - p. i 2. Cover image - p. i 3. Title page - p. ii 4. Table of Contents - p. iii 5. Copyright - p. iv 6. Foreword to second edition - p. xi 7. Foreword - p. xiii 8. Chapter one. Gaussian optics and transfer matrices - p. 1 9. Chapter two. General relations for the motion of charged particles in electromagnetic fields - p. 21 10. Chapter three. Quadrupole lenses - p. 39 11. Abstract - p. 39 12. 3.1 The electric and magnetic fields in quadrupole lenses - p. 40 13. 3.2 Particle trajectories in quadrupole lenses - p. 43 14. 3.3 The design of quadrupole multiplets - p. 49 15. 3.4 Thin-lens approximations for quadrupole multiplets - p. 59 16. References - p. 66 17. Chapter four. Sector fields - p. 67 18. Abstract - p. 67 19. 4.1 Homogeneous magnetic sector fields - p. 68 20. 4.2 Inhomogeneous magnetic sector fields formed by inclined planar pole faces (wedge magnets) - p. 86 21. 4.3 Radially inhomogeneous sector fields formed by conical pole faces or toroidal electrodes - p. 92 22. 4.4 Particle flight times in radially inhomogeneous sector fields, quadrupoles, and field-free regions - p. 106 23. Appendix - p. 109 24. References - p. 112 25. Chapter five. Charged particle beams in phase space - p. 113 26. Chapter six. Particle beams in periodic structures - p. 145 27. Chapter seven. Fringe fields - p. 161 28. Chapter eight. Image aberrations - p. 183 29. Abstract - p. 183 30. 8.1 Systematics of image aberrations - p. 183 31. 8.2 Origin of image aberrations - p. 190 32. 8.3 Relations between coefficients of Eq. (8.2) due to the condition of symplecticity - p. 201 33. 8.4 Image aberrations of nth order - p. 211 34. Appendix - p. 222 35. References - p. 228 36. Chapter nine. Design of particle spectrometers and beam guide lines - p. 229 37. Abstract - p. 229 38. 9.1 Single-sector magnetic spectrometers - p. 229 39. 9.2 A quality factor for particle spectrometers - p. 235 40. 9.3 Time-of-flight particle spectrometers - p. 245 41. 9.4 The alignment of an optical system and the correction of its aberrations - p. 251 42. References - p. 265 43. Chapter ten. Time-of-flight mass spectrographs - p. 267 44. Index - p. 301
Optics of Charged Particles, 2nd edition, describes how charged particles move in the fields of magnetic and electrostatic dipoles, quadrupoles, higher order multipoles, and field-free regions. Since the first edition, published over 30 years ago, new technologies have emerged and have been used for new ion optical instruments like, for instance, time-of-flight mass analyzers, which are described now. Fully updated and revised, this new edition provides ways to design mass separators, spectrographs, and spectrometers, which are the key tools in organic chemistry and for drug developments, in environmental trace analyses and for investigations in nuclear physics like the search for super heavy elements as well as molecules in space science.
The book discusses individual particle trajectories as well as particle beams in space and in phase-space, and it provides guidelines for the design of particle optical instruments. For experienced researchers, working in the field, it highlights the latest developments in new ion optical instruments and provides guidelines and examples for the design of new instruments for the transport of beams of charged particles and the mass/charge or energy/charge analyses of ions. Furthermore, it provides background knowledge required to accurately understand and analyze results, when developing ion-optical instruments.
By providing a comprehensive overview of the field of charged particle optics, this edition of the book supports all those working, directly or indirectly, with charged-particle research or the development of ion- and electron-analyzing instruments.
1. Title of Book - p. i 2. Cover image - p. i 3. Title page - p. ii 4. Table of Contents - p. iii 5. Copyright - p. iv 6. Foreword to second edition - p. xi 7. Foreword - p. xiii 8. Chapter one. Gaussian optics and transfer matrices - p. 1 9. Chapter two. General relations for the motion of charged particles in electromagnetic fields - p. 21 10. Chapter three. Quadrupole lenses - p. 39 11. Abstract - p. 39 12. 3.1 The electric and magnetic fields in quadrupole lenses - p. 40 13. 3.2 Particle trajectories in quadrupole lenses - p. 43 14. 3.3 The design of quadrupole multiplets - p. 49 15. 3.4 Thin-lens approximations for quadrupole multiplets - p. 59 16. References - p. 66 17. Chapter four. Sector fields - p. 67 18. Abstract - p. 67 19. 4.1 Homogeneous magnetic sector fields - p. 68 20. 4.2 Inhomogeneous magnetic sector fields formed by inclined planar pole faces (wedge magnets) - p. 86 21. 4.3 Radially inhomogeneous sector fields formed by conical pole faces or toroidal electrodes - p. 92 22. 4.4 Particle flight times in radially inhomogeneous sector fields, quadrupoles, and field-free regions - p. 106 23. Appendix - p. 109 24. References - p. 112 25. Chapter five. Charged particle beams in phase space - p. 113 26. Chapter six. Particle beams in periodic structures - p. 145 27. Chapter seven. Fringe fields - p. 161 28. Chapter eight. Image aberrations - p. 183 29. Abstract - p. 183 30. 8.1 Systematics of image aberrations - p. 183 31. 8.2 Origin of image aberrations - p. 190 32. 8.3 Relations between coefficients of Eq. (8.2) due to the condition of symplecticity - p. 201 33. 8.4 Image aberrations of nth order - p. 211 34. Appendix - p. 222 35. References - p. 228 36. Chapter nine. Design of particle spectrometers and beam guide lines - p. 229 37. Abstract - p. 229 38. 9.1 Single-sector magnetic spectrometers - p. 229 39. 9.2 A quality factor for particle spectrometers - p. 235 40. 9.3 Time-of-flight particle spectrometers - p. 245 41. 9.4 The alignment of an optical system and the correction of its aberrations - p. 251 42. References - p. 265 43. Chapter ten. Time-of-flight mass spectrographs - p. 267 44. Index - p. 301
