Advances in Imaging and Electron Physics, Volume 238 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
1. 1 Introduction - p. 48 2. 2 Numerical methods of solving equations of motion - p. 50 3. 3 Aberration coefficient structure - p. 63 4. 4 Optimization and partial correction of aberrations - p. 94 5. 5 Concluding remarks - p. 145 6. References - p. 148 7. Chapter Three: Emittance and brightness: Definitions and measurements - p. 163 8. 1 Introduction - p. 164 9. 2 Definitions and basic properties - p. 168 10. 3 Measurement of emittance and brightness - p. 207 11. 4 Conclusion - p. 257 12. Acknowledgments - p. 260 13. References - p. 260 14. Index - p. 267
Advances in Imaging and Electron Physics, Volume 238 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
1. 1 Introduction - p. 48 2. 2 Numerical methods of solving equations of motion - p. 50 3. 3 Aberration coefficient structure - p. 63 4. 4 Optimization and partial correction of aberrations - p. 94 5. 5 Concluding remarks - p. 145 6. References - p. 148 7. Chapter Three: Emittance and brightness: Definitions and measurements - p. 163 8. 1 Introduction - p. 164 9. 2 Definitions and basic properties - p. 168 10. 3 Measurement of emittance and brightness - p. 207 11. 4 Conclusion - p. 257 12. Acknowledgments - p. 260 13. References - p. 260 14. Index - p. 267
