Fundamentals of Microstructure Characterization of Materials is an essential resource for understanding the various techniques and methods used in material characterization. This book delves into spectroscopic methods involving electromagnetic radiation, X-ray photoelectron analysis, atomic emission spectroscopy, and more. It provides thorough explanations of scanning electron microscopy and sample preparation techniques, including cutting, grinding, polishing, and etching.
Other important points covered in the book include microscopy fundamentals such as lens types, optical image formation principles, depth of field, and depth of focus. Statistical analysis methods, including cumulative distribution function, probability density function, and Gaussian distribution, are also discussed. Additionally, the application of X-ray diffraction in phase analysis of materials is explored in detail.
1. Title of Book - p. i 2. Cover image - p. i 3. Title page - p. ii 4. Table of Contents - p. iii 5. Copyright - p. iv 6. Dedication - p. v 7. Chapter 1. Wave properties - p. 1 8. Chapter 2. Spectroscopy techniques - p. 31 9. Chapter 3. Sample preparation methods for materials - p. 71 10. Chapter 4. Elementary crystallography - p. 115 11. Chapter 5. Microscopy in materials characterization - p. 171 12. Chapter 6. Scanning electron microscopy - p. 213 13. Chapter 7. Statistical analysis in materials science and engineering - p. 255 14. Chapter 8. X-ray diffraction - p. 293 15. Chapter 9. Crystallographic texture analysis: pole figures, stereographic projections, and texture characterization - p. 363 16. Chapter 10. Comprehensive question bank - p. 385 17. Index - p. 495
Fundamentals of Microstructure Characterization of Materials is an essential resource for understanding the various techniques and methods used in material characterization. This book delves into spectroscopic methods involving electromagnetic radiation, X-ray photoelectron analysis, atomic emission spectroscopy, and more. It provides thorough explanations of scanning electron microscopy and sample preparation techniques, including cutting, grinding, polishing, and etching.
Other important points covered in the book include microscopy fundamentals such as lens types, optical image formation principles, depth of field, and depth of focus. Statistical analysis methods, including cumulative distribution function, probability density function, and Gaussian distribution, are also discussed. Additionally, the application of X-ray diffraction in phase analysis of materials is explored in detail.
1. Title of Book - p. i 2. Cover image - p. i 3. Title page - p. ii 4. Table of Contents - p. iii 5. Copyright - p. iv 6. Dedication - p. v 7. Chapter 1. Wave properties - p. 1 8. Chapter 2. Spectroscopy techniques - p. 31 9. Chapter 3. Sample preparation methods for materials - p. 71 10. Chapter 4. Elementary crystallography - p. 115 11. Chapter 5. Microscopy in materials characterization - p. 171 12. Chapter 6. Scanning electron microscopy - p. 213 13. Chapter 7. Statistical analysis in materials science and engineering - p. 255 14. Chapter 8. X-ray diffraction - p. 293 15. Chapter 9. Crystallographic texture analysis: pole figures, stereographic projections, and texture characterization - p. 363 16. Chapter 10. Comprehensive question bank - p. 385 17. Index - p. 495
