Principles of Electron Optic: Volume Three: Wave Optics, discusses this essential topic in microscopy to help readers understand the propagation of electrons from the source to the specimen, and through the latter (and from it) to the image plane of the instrument. In addition, it also explains interference phenomena, notably holography, and informal coherence theory. This third volume accompanies volumes one and two that cover new content on holography and interference, improved and new modes of image formation, aberration corrected imaging, simulation, and measurement, 3D-reconstruction, and more.
The study of such beams forms the subject of electron optics, which divides naturally into geometrical optics where effects due to wavelength are neglected, with wave optics considered.
1. Chapter 54. Introduction - p. 1457 2. Part XI: Wave Mechanics - p. 1472 3. Chapter 55. The Schrödinger Equation - p. 1475 4. Chapter 56. The Relativistic Wave Equation - p. 1481 5. Chapter 57. The Eikonal Approximation - p. 1495 6. Chapter 58. Paraxial Wave Optics - p. 1505 7. Chapter 59. The General Theory of Electron Diffraction and Interference - p. 1521 8. Chapter 60. Elementary Diffraction Patterns - p. 1541 9. Part XII: Electron Interference and Electron Holography - p. 1565 10. Chapter 61. General Introduction - p. 1569 11. Chapter 62. Interferometry - p. 1581 12. Chapter 63. Holography - p. 1623 13. Abstract - p. 1623 14. 63.1 In-Line Holography - p. 1625 15. 63.2 Off-Axis Holography: Hologram Formation in a Two-Beam Interferometer - p. 1630 16. 63.3 Reconstruction Procedures - p. 1639 17. 63.4 Holography in the Scanning Transmission Electron Microscope - p. 1645 18. 63.5 Reflection Holography - p. 1648 19. 63.6 Applications and Related Topics - p. 1681 20. 63.7 Propagation and Reconstruction of the Density Matrix - p. 1674 21. Part XIII: Theory of Image Formation - p. 1680 22. Chapter 64. General Introduction - p. 1685 23. Chapter 65. Fundamentals of Transfer Theory - p. 1691 24. Chapter 66. Image Formation in the Conventional Transmission Electron Microscope - p. 1707 25. Abstract - p. 1707 26. 66.1 Image Contrast for Weakly Scattering Specimens - p. 1707 27. 66.2 Spectral Distributions of the Illumination - p. 1719 28. 66.3 Particular Forms of the Spectra - p. 1730 29. 66.4 Optimum Defocus and Resolution Limit - p. 1735 30. 66.5 Extensions of the Theory - p. 1741 31. 66.6 Forms of the Aperture Function TA: Zone Plates and Phase Plates - p. 1752 32. 66.7 Transfer Theory and Crystalline Specimens - p. 1782 33. 66.8 Contrast Transfer in Aberration-Corrected Microscopes - p. 1787 34. 66.9 Other Transforms Having a Convolution Theorem - p. 1793 35. Chapter 67. Image Formation in the Scanning Transmission Electron Microscope - p. 1797 36. Abstract - p. 1797 37. 67.1 Introduction - p. 1797 38. 67.2 Wave Propagation in STEM - p. 1797 39. 67.3 Detector Geometry - p. 1805 40. 67.4 Ptychography - p. 1834 41. 67.5 Detector Technology - p. 1845 42. 67.6 Concluding Remarks and Historical Notes - p. 1849 43. Chapter 68. Statistical Parameter Estimation Theory - p. 1853 44. Notes and References - p. 1869 45. Preface & Chapter 54 - p. 1869 46. Part XI, Chapters 55–60 - p. 1881 47. Part XII, Chapters 61–63 - p. 1885 48. Part XIII, Chapters 64–68 - p. 1924 49. Conference Proceedings - p. 1977 50. 1. International Congresses on Electron Microscopy, later International Microscopy Congresses - p. 1978 51. 2. European Regional Congresses on Electron Microscopy, later European Microscopy Congresses - p. 1979 52. 3. Asia-Pacific Congresses on Electron Microscopy, later Asia–Pacific Microscopy Congresses - p. 1980 53. 4. Charged Particle Optics Conferences - p. 1981 54. 5. High-voltage Electron Microscopy Conferences - p. 1982 55. 6. EMAG [Electron Microscopy and Analysis Group of the Institute of Physics] Meetings - p. 1982 56. 7. Multinational Congresses on (Electron) Microscopy (MCEM, MCM) - p. 1983 57. 8. The Dreiländertagungen (Germany, Austria, Switzerland) and related meetings - p. 1984 58. 9. Recent Trends in Charged Particle Optics and Surface Physics Instrumentation (Skalský Dvůr) - p. 1985 59. 10. SPIE Proceedings - p. 1985 60. 11. Soviet All-Union Conferences on Electron Microscopy, later Russian Conferences on Electron Microscopy - p. 1986 61. 12. Problems of Theoretical and Applied Electron Optics [Problemyi Teoreticheskoi i Prikladnoi Elektronnoi Optiki]1 - p. 1987 62. 13. Mathematical Morphology and Its Applications to Signal and Image Processing - p. 1987 63. 14. Related Meetings - p. 1988 64. Index - p. 1989
Principles of Electron Optic: Volume Three: Wave Optics, discusses this essential topic in microscopy to help readers understand the propagation of electrons from the source to the specimen, and through the latter (and from it) to the image plane of the instrument. In addition, it also explains interference phenomena, notably holography, and informal coherence theory. This third volume accompanies volumes one and two that cover new content on holography and interference, improved and new modes of image formation, aberration corrected imaging, simulation, and measurement, 3D-reconstruction, and more.
The study of such beams forms the subject of electron optics, which divides naturally into geometrical optics where effects due to wavelength are neglected, with wave optics considered.
1. Chapter 54. Introduction - p. 1457 2. Part XI: Wave Mechanics - p. 1472 3. Chapter 55. The Schrödinger Equation - p. 1475 4. Chapter 56. The Relativistic Wave Equation - p. 1481 5. Chapter 57. The Eikonal Approximation - p. 1495 6. Chapter 58. Paraxial Wave Optics - p. 1505 7. Chapter 59. The General Theory of Electron Diffraction and Interference - p. 1521 8. Chapter 60. Elementary Diffraction Patterns - p. 1541 9. Part XII: Electron Interference and Electron Holography - p. 1565 10. Chapter 61. General Introduction - p. 1569 11. Chapter 62. Interferometry - p. 1581 12. Chapter 63. Holography - p. 1623 13. Abstract - p. 1623 14. 63.1 In-Line Holography - p. 1625 15. 63.2 Off-Axis Holography: Hologram Formation in a Two-Beam Interferometer - p. 1630 16. 63.3 Reconstruction Procedures - p. 1639 17. 63.4 Holography in the Scanning Transmission Electron Microscope - p. 1645 18. 63.5 Reflection Holography - p. 1648 19. 63.6 Applications and Related Topics - p. 1681 20. 63.7 Propagation and Reconstruction of the Density Matrix - p. 1674 21. Part XIII: Theory of Image Formation - p. 1680 22. Chapter 64. General Introduction - p. 1685 23. Chapter 65. Fundamentals of Transfer Theory - p. 1691 24. Chapter 66. Image Formation in the Conventional Transmission Electron Microscope - p. 1707 25. Abstract - p. 1707 26. 66.1 Image Contrast for Weakly Scattering Specimens - p. 1707 27. 66.2 Spectral Distributions of the Illumination - p. 1719 28. 66.3 Particular Forms of the Spectra - p. 1730 29. 66.4 Optimum Defocus and Resolution Limit - p. 1735 30. 66.5 Extensions of the Theory - p. 1741 31. 66.6 Forms of the Aperture Function TA: Zone Plates and Phase Plates - p. 1752 32. 66.7 Transfer Theory and Crystalline Specimens - p. 1782 33. 66.8 Contrast Transfer in Aberration-Corrected Microscopes - p. 1787 34. 66.9 Other Transforms Having a Convolution Theorem - p. 1793 35. Chapter 67. Image Formation in the Scanning Transmission Electron Microscope - p. 1797 36. Abstract - p. 1797 37. 67.1 Introduction - p. 1797 38. 67.2 Wave Propagation in STEM - p. 1797 39. 67.3 Detector Geometry - p. 1805 40. 67.4 Ptychography - p. 1834 41. 67.5 Detector Technology - p. 1845 42. 67.6 Concluding Remarks and Historical Notes - p. 1849 43. Chapter 68. Statistical Parameter Estimation Theory - p. 1853 44. Notes and References - p. 1869 45. Preface & Chapter 54 - p. 1869 46. Part XI, Chapters 55–60 - p. 1881 47. Part XII, Chapters 61–63 - p. 1885 48. Part XIII, Chapters 64–68 - p. 1924 49. Conference Proceedings - p. 1977 50. 1. International Congresses on Electron Microscopy, later International Microscopy Congresses - p. 1978 51. 2. European Regional Congresses on Electron Microscopy, later European Microscopy Congresses - p. 1979 52. 3. Asia-Pacific Congresses on Electron Microscopy, later Asia–Pacific Microscopy Congresses - p. 1980 53. 4. Charged Particle Optics Conferences - p. 1981 54. 5. High-voltage Electron Microscopy Conferences - p. 1982 55. 6. EMAG [Electron Microscopy and Analysis Group of the Institute of Physics] Meetings - p. 1982 56. 7. Multinational Congresses on (Electron) Microscopy (MCEM, MCM) - p. 1983 57. 8. The Dreiländertagungen (Germany, Austria, Switzerland) and related meetings - p. 1984 58. 9. Recent Trends in Charged Particle Optics and Surface Physics Instrumentation (Skalský Dvůr) - p. 1985 59. 10. SPIE Proceedings - p. 1985 60. 11. Soviet All-Union Conferences on Electron Microscopy, later Russian Conferences on Electron Microscopy - p. 1986 61. 12. Problems of Theoretical and Applied Electron Optics [Problemyi Teoreticheskoi i Prikladnoi Elektronnoi Optiki]1 - p. 1987 62. 13. Mathematical Morphology and Its Applications to Signal and Image Processing - p. 1987 63. 14. Related Meetings - p. 1988 64. Index - p. 1989
