Advances in Imaging and Electron Physics, Volume 218 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Specific chapters in this release cover Phase retrieval methods applied to coherent imaging, X-ray phase-contrast imaging: a broad overview of some fundamentals, Graphene and borophene as nanoscopic materials for electronics – with review of the physics, and more.
1. 1 Introduction to the imaging of a non-crystalline object and the phase problem - p. page1 2. 2 Survey of interferometric/coherent imaging schemes - p. page5 3. 3 Development of in-line holography and CDI with low-energy electrons - p. 20 4. 4 Future directions - p. 41 5. References - p. 54 6. Chapter Two: X-ray phase-contrast imaging: a broad overview of some fundamentals - p. 63 7. Abstract - p. 63 8. 1 Introduction - p. 64 9. 2 X-ray imaging basics - p. 67 10. 3 The forward problem: modeling X-ray phase-contrast images - p. 93 11. 4 The inverse problem: retrieving sample information from X-ray phase-contrast images - p. 126 12. Acknowledgements - p. 147 13. References - p. 148 14. Chapter Three: Graphyne and borophene as nanoscopic materials for electronics — with review of the physics - p. 159 15. Abstract - p. 159 16. 1 Introduction - p. page159 17. 2 Formulation of the bandstructure equations in a tractable tight-binding format - p. 160 18. 3 Eigenenergies, Fermi velocities, overlap & hopping integrals - p. 170 19. 4 Eigenvectors based upon 2-spinors - p. 169 20. 5 Eigenvectors based upon 4-spinors - p. 174 21. 6 Conclusions and future outlook - p. 177 22. References - p. page179 23. Chapter Four: The ESAB effect and the physical meaning of the vector potential - p. 181 24. Chapter Five: Electron image plane off-axis holography of atomic structures - p. 195 25. Abstract - p. 195 26. 1 Introduction - p. page195 27. 2 Principles of off-axis image plane electron holography - p. 203 28. 3 Performance of image plane electron holography - p. page211 29. 4 Influence of the lens aberrations in the high-resolution domain - p. 229 30. 5 Reconstruction of the image wave and correction of aberrations - p. page239 31. 6 Experimental realization of holography of atomic structures - p. 240 32. 7 Conclusion - p. 253 33. 8 List of symbols - p. 256 34. Acknowledgements - p. page258 35. References - p. 259 36. References - p. 260 37. Index - p. 260
Advances in Imaging and Electron Physics, Volume 218 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Specific chapters in this release cover Phase retrieval methods applied to coherent imaging, X-ray phase-contrast imaging: a broad overview of some fundamentals, Graphene and borophene as nanoscopic materials for electronics – with review of the physics, and more.
1. 1 Introduction to the imaging of a non-crystalline object and the phase problem - p. page1 2. 2 Survey of interferometric/coherent imaging schemes - p. page5 3. 3 Development of in-line holography and CDI with low-energy electrons - p. 20 4. 4 Future directions - p. 41 5. References - p. 54 6. Chapter Two: X-ray phase-contrast imaging: a broad overview of some fundamentals - p. 63 7. Abstract - p. 63 8. 1 Introduction - p. 64 9. 2 X-ray imaging basics - p. 67 10. 3 The forward problem: modeling X-ray phase-contrast images - p. 93 11. 4 The inverse problem: retrieving sample information from X-ray phase-contrast images - p. 126 12. Acknowledgements - p. 147 13. References - p. 148 14. Chapter Three: Graphyne and borophene as nanoscopic materials for electronics — with review of the physics - p. 159 15. Abstract - p. 159 16. 1 Introduction - p. page159 17. 2 Formulation of the bandstructure equations in a tractable tight-binding format - p. 160 18. 3 Eigenenergies, Fermi velocities, overlap & hopping integrals - p. 170 19. 4 Eigenvectors based upon 2-spinors - p. 169 20. 5 Eigenvectors based upon 4-spinors - p. 174 21. 6 Conclusions and future outlook - p. 177 22. References - p. page179 23. Chapter Four: The ESAB effect and the physical meaning of the vector potential - p. 181 24. Chapter Five: Electron image plane off-axis holography of atomic structures - p. 195 25. Abstract - p. 195 26. 1 Introduction - p. page195 27. 2 Principles of off-axis image plane electron holography - p. 203 28. 3 Performance of image plane electron holography - p. page211 29. 4 Influence of the lens aberrations in the high-resolution domain - p. 229 30. 5 Reconstruction of the image wave and correction of aberrations - p. page239 31. 6 Experimental realization of holography of atomic structures - p. 240 32. 7 Conclusion - p. 253 33. 8 List of symbols - p. 256 34. Acknowledgements - p. page258 35. References - p. 259 36. References - p. 260 37. Index - p. 260
