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Advances in Imaging and Electron Physics, Volume 216, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • Contains contributions from leading authorities on the subject matter
  • Informs and updates on the latest developments in the field of imaging and electron physics
  • Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource

1. Cover image - p. i 2. Title page - p. ii 3. Table of Contents - p. iii 4. Copyright - p. iv 5. Contributor - p. xi 6. Preface - p. xiii 7. Editorial Preface - p. xvii 8. Chapter One: First principles - p. 1 9. Chapter Two: Complete lattices - p. 17 10. Chapter Three: Operators on complete lattices - p. 45 11. Chapter Four: Operators which are translation invariant - p. 71 12. Chapter Five: Adjunctions, dilations, and erosions - p. 121 13. Chapter Six: Openings and closings - p. 177 14. Chapter Seven: Hit-or-miss topology and semi-continuity - p. 217 15. Chapter Eight: Discretization - p. 253 16. Chapter Nine: Convexity, distance, and connectivity - p. 269 17. Chapter Ten: Lattice representations of functions - p. 331 18. Chapter Eleven: Morphology for grey-scale images - p. 355 19. Chapter Twelve: Morphological filters - p. 403 20. Chapter Thirteen: Filtering and iteration - p. 431 21. References - p. 473 22. Notation Index - p. 485 23. Subject Index - p. 491

Descripcion
Descripción

Advances in Imaging and Electron Physics, Volume 216, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • Contains contributions from leading authorities on the subject matter
  • Informs and updates on the latest developments in the field of imaging and electron physics
  • Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource

1. Cover image - p. i 2. Title page - p. ii 3. Table of Contents - p. iii 4. Copyright - p. iv 5. Contributor - p. xi 6. Preface - p. xiii 7. Editorial Preface - p. xvii 8. Chapter One: First principles - p. 1 9. Chapter Two: Complete lattices - p. 17 10. Chapter Three: Operators on complete lattices - p. 45 11. Chapter Four: Operators which are translation invariant - p. 71 12. Chapter Five: Adjunctions, dilations, and erosions - p. 121 13. Chapter Six: Openings and closings - p. 177 14. Chapter Seven: Hit-or-miss topology and semi-continuity - p. 217 15. Chapter Eight: Discretization - p. 253 16. Chapter Nine: Convexity, distance, and connectivity - p. 269 17. Chapter Ten: Lattice representations of functions - p. 331 18. Chapter Eleven: Morphology for grey-scale images - p. 355 19. Chapter Twelve: Morphological filters - p. 403 20. Chapter Thirteen: Filtering and iteration - p. 431 21. References - p. 473 22. Notation Index - p. 485 23. Subject Index - p. 491

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Autores
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