Advances in Imaging and Electron Physics, Volume 219, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
1. Chapter One: Introduction to strain characterization methods in Transmission Electron Microscopy - p. 1 2. Chapter Two: Moiré sampling in Scanning Transmission Electron Microscopy - p. 39 3. Abstract - p. 39 4. 1 Signal sampling and recovery - p. 40 5. 2 Sampling in STEM - p. 58 6. 3 Recovery of the crystal lattices from a STEM Moiré hologram - p. 67 7. 4 Conclusions of the chapter - p. 75 8. References - p. 76 9. Chapter Three: Scanning Transmission Electron Microscopy Moiré sampling Geometrical Phase Analysis (STEM Moiré GPA) - p. 79 10. Abstract - p. 80 11. 1 Introduction of STEM Moiré GPA - p. 80 12. 2 Materials and methods - p. 88 13. 3 Strain characterization results on the calibrated sample - p. 93 14. 4 Experimental considerations of STEM Moiré GPA - p. 106 15. 5 Application of the SMG protocol on the calibration sample - p. 120 16. 6 Conclusions of the chapter - p. 126 17. References - p. 130 18. Chapter Four: Performance of Scanning Transmission Electron Microscopy Moiré Sampling Geometrical Phase Analysis - p. 133 19. Chapter Five: Applications of Scanning Transmission Electron Microscopy Moiré Sampling Geometrical Phase Analysis - p. 187 20. Chapter Six: Quasi-analytical modelling of charged particle ensembles in neutral gas flow and electric fields - p. 211 21. Chapter Seven: Superconducting electron lenses - p. 229 22. Chapter Eight: Lorentz microscopy or electron phase microscopy of magnetic objects - p. 265 23. Abstract - p. 266 24. 1 General introduction - p. 266 25. 2 The interaction of an electron with a magnetic field - p. 271 26. 3 Calculation of the image intensity - p. 285 27. 4 Validity criteria for the pseudo-classical approximations - p. 294 28. 5 Image transfer theory - p. 312 29. 6 Remarks on domain wall measurements - p. 317 30. 7 Conclusions - p. 320 31. Acknowledgements - p. 321 32. References - p. 321 33. Index - p. 322
Advances in Imaging and Electron Physics, Volume 219, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
1. Chapter One: Introduction to strain characterization methods in Transmission Electron Microscopy - p. 1 2. Chapter Two: Moiré sampling in Scanning Transmission Electron Microscopy - p. 39 3. Abstract - p. 39 4. 1 Signal sampling and recovery - p. 40 5. 2 Sampling in STEM - p. 58 6. 3 Recovery of the crystal lattices from a STEM Moiré hologram - p. 67 7. 4 Conclusions of the chapter - p. 75 8. References - p. 76 9. Chapter Three: Scanning Transmission Electron Microscopy Moiré sampling Geometrical Phase Analysis (STEM Moiré GPA) - p. 79 10. Abstract - p. 80 11. 1 Introduction of STEM Moiré GPA - p. 80 12. 2 Materials and methods - p. 88 13. 3 Strain characterization results on the calibrated sample - p. 93 14. 4 Experimental considerations of STEM Moiré GPA - p. 106 15. 5 Application of the SMG protocol on the calibration sample - p. 120 16. 6 Conclusions of the chapter - p. 126 17. References - p. 130 18. Chapter Four: Performance of Scanning Transmission Electron Microscopy Moiré Sampling Geometrical Phase Analysis - p. 133 19. Chapter Five: Applications of Scanning Transmission Electron Microscopy Moiré Sampling Geometrical Phase Analysis - p. 187 20. Chapter Six: Quasi-analytical modelling of charged particle ensembles in neutral gas flow and electric fields - p. 211 21. Chapter Seven: Superconducting electron lenses - p. 229 22. Chapter Eight: Lorentz microscopy or electron phase microscopy of magnetic objects - p. 265 23. Abstract - p. 266 24. 1 General introduction - p. 266 25. 2 The interaction of an electron with a magnetic field - p. 271 26. 3 Calculation of the image intensity - p. 285 27. 4 Validity criteria for the pseudo-classical approximations - p. 294 28. 5 Image transfer theory - p. 312 29. 6 Remarks on domain wall measurements - p. 317 30. 7 Conclusions - p. 320 31. Acknowledgements - p. 321 32. References - p. 321 33. Index - p. 322
